Superior Precision in Surface Measurement!

ASENTEK manufactures optical profilometers that provide high precision and accuracy for surface measurement. Using advanced interferometric techniques, these instruments offer micrometer and nanometer-level accuracy in applications such as nanotechnology, materials science and manufacturing, while protecting samples from damage during measurement.

Optical 3D Profilers

Precision in Surface Measurement
Our optical profilometers provide highly accurate 3D surface profiling using the principles of interferometry. Techniques such as white light microscopic interferometry and phase shift interferometry measure surface topography and roughness in high detail. Delivering accuracy and speed across a wide range of applications, from small surfaces to large materials.

Product Range
Our optical profilometers for various needs:
– NanoSharp3D: Offers nanometer-level accuracy for the highest precision. Ideal for high-precision research and production with advanced features such as surface roughness analysis, profile graphs, etc.
– MicroSharp3D: An affordable solution for applications requiring micrometer accuracy. It offers a wider field of view, fast scanning and efficient data acquisition, suitable for high-volume environments.

High Precision & Accuracy Contactless & Damage Free Measurement Advanced Surface Analysis User Friendly Software Wide Industrial Application Area
Nanometer and micrometer level measurement accuracy
Precise surface analysis without touching the sample
Measuring parameters such as surface roughness, pitch height, waviness
Real-time 3D visualization
Semiconductor, optics, coatings and materials science applications
High resolution interferometry technology
The ideal solution for fragile and valuable materials
Support for white light interferometry and phase-shift interferometry
Multi-parameter analysis and customizable settings
Optimized design for quality control and research laboratories
Detailed 3D analysis of complex surfaces
No risk of mechanical stress or damage during measurement
Detailed mapping of complex and micro structures
Easy data transfer and reporting options
Fast and precise measurement capabilities in mass production

Why ASENTEK High Voltage Power Supplies?

High Precision and Accuracy

Provides highly accurate surface measurement from nanometers to micrometers.

Non-Destructive Measurement

Protects the integrity of samples with non-contact, non-destructive measurement.

Advanced Surface Analysis

It offers detailed surface analysis such as roughness, step height and 3D profile analysis.

User-Friendly Software:

It provides easy operation, real-time visualization and customizable settings.

Wide Application Range

It is used in areas such as manufacturing, materials science, semiconductors, optics and coatings.