Superior Precision in Surface Measurement!
ASENTEK manufactures optical profilometers that provide high precision and accuracy for surface measurement. Using advanced interferometric techniques, these instruments offer micrometer and nanometer-level accuracy in applications such as nanotechnology, materials science and manufacturing, while protecting samples from damage during measurement.
Optical 3D Profilers
Precision in Surface Measurement
Our optical profilometers provide highly accurate 3D surface profiling using the principles of interferometry. Techniques such as white light microscopic interferometry and phase shift interferometry measure surface topography and roughness in high detail. Delivering accuracy and speed across a wide range of applications, from small surfaces to large materials.
Product Range
Our optical profilometers for various needs:
– NanoSharp3D: Offers nanometer-level accuracy for the highest precision. Ideal for high-precision research and production with advanced features such as surface roughness analysis, profile graphs, etc.
– MicroSharp3D: An affordable solution for applications requiring micrometer accuracy. It offers a wider field of view, fast scanning and efficient data acquisition, suitable for high-volume environments.
| High Precision & Accuracy | Contactless & Damage Free Measurement | Advanced Surface Analysis | User Friendly Software | Wide Industrial Application Area |
|---|---|---|---|---|
Nanometer and micrometer level measurement accuracy |
Precise surface analysis without touching the sample |
Measuring parameters such as surface roughness, pitch height, waviness |
Real-time 3D visualization |
Semiconductor, optics, coatings and materials science applications |
High resolution interferometry technology |
The ideal solution for fragile and valuable materials |
Support for white light interferometry and phase-shift interferometry |
Multi-parameter analysis and customizable settings |
Optimized design for quality control and research laboratories |
Detailed 3D analysis of complex surfaces |
No risk of mechanical stress or damage during measurement |
Detailed mapping of complex and micro structures |
Easy data transfer and reporting options |
Fast and precise measurement capabilities in mass production |
Why ASENTEK High Voltage Power Supplies?
High Precision and Accuracy
Provides highly accurate surface measurement from nanometers to micrometers.
Non-Destructive Measurement
Protects the integrity of samples with non-contact, non-destructive measurement.
Advanced Surface Analysis
It offers detailed surface analysis such as roughness, step height and 3D profile analysis.
User-Friendly Software:
It provides easy operation, real-time visualization and customizable settings.
Wide Application Range
It is used in areas such as manufacturing, materials science, semiconductors, optics and coatings.